搜索结果: 1-15 共查到“Metrology”相关记录47条 . 查询时间(0.078 秒)
Academy of Mathematics and Systems Science, CAS Colloquia & Seminars：Cooperation between Coherent Control and Noises in Quantum Metrology
量子计量 相干控制 噪声
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2023/11/7
In this work, the cooperation between coherent control and noises in open spin systems is studied, aiming to demonstrate that such cooperation can provide new possibilities for parametrization in quan...
2018年SPIE陡峭色散工程与光原子精密测量会议（SPIE Steep Dispersion Engineering and Opto-Atomic Precision Metrology XI）
2018年 SPIE 陡峭色散工程 光原子 精密测量 会议
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2017/11/28
2018年SPIE陡峭色散工程与光原子精密测量会议（SPIE Steep Dispersion Engineering and Opto-Atomic Precision Metrology XI）。
2018年SPIE光学制造，测试和计量会议（SPIE Optical Fabrication,Testing,and Metrology VI）
2018年 SPIE 光学制造，测试和计量 会议
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2017/10/27
Today’s optical fabrication technologies are facing ever-increasing demands from industry and research. This is driven by tough requirements for cost and time reduction in production and R&D as well a...
2018年SPIE微光刻的计量，检验和过程控制会议（SPIE Metrology,Inspection,and Process Control for Microlithography XXXII）
2018年 SPIE 微光刻的计量，检验和过程控制 会议
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2017/10/27
2018年SPIE微光刻的计量，检验和过程控制会议（SPIE Metrology,Inspection,and Process Control for Microlithography XXXII）。
2018年SPIE三维光学计量检验实际应用会议（SPIE Dimensional Optical Metrology and Inspection for Practical Applications VII）
2018年 SPIE 三维光学计量检验实际应用 会议
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2017/10/27
This conference will focus on methods, analysis, and applications of optical metrology and inspection as applied to various industries, with particular emphasis on practical applications for non-optic...
The International Conference on Metrology (abbreviated ICONMET) is a biennial scientific meeting on metrology organized by RCM – LIPI (Research Center for Metrology – Indonesia Institute of Science (L...
2017SPIEX射线和EUV光学计量学进展专题会议（Advances in Metrology for X-Ray and EUV Optics VII）
2017 SPIEX 射线和EUV光学计量学进展 专题会议
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2017/4/25
2017SPIEX射线和EUV光学计量学进展专题会议（Advances in Metrology for X-Ray and EUV Optics VII）。
2017 SPIE 光学计量建模会议（2017 Conference on Modeling Aspects in Optical Metrology）
2017 SPIE 光学计量 建模 会议
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2017/4/25
Conference Sessions 1: Light Scattering 2: Optical Systems 3: Mueller Polarimetry 4: Interferometry and Phase I 5: Interferometry and Phase II .
Conference Sessions:1: 3D Shape Measurement ;2: Polarization Measurement and Techniques ;3: Fine Scale Feature Metrology Optical Engineering Plenary Session Optomechanical/Instrument Technical Group E...
2017 SPIE X射线和EUV光学计量学进展专题会议（Advances in Metrology for X-Ray and EUV Optics VII）
2017 SPIE X射线 EUV光学计量学进展 专题会议
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2017/4/25
Conference Sessions:1: At-Wavelength Metrology ;2: Metrology of VLS Gratings Technology Hot Topics: How Optics and Photonics Drive Innovation ;3: Calibration and Nanoradian Metrology ;4: Metrology Fac...
2017SPIE光学计量建模会议（2017 Conference on Modeling Aspects in Optical Metrology）
2017 SPIE 光学计量建模 会议
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2017/4/25
2017SPIE光学计量建模会议（2017 Conference on Modeling Aspects in Optical Metrology）。
2017SPIE光学计量会议（SPIE Optical Metrology 2017）
2017 SPIE 光学计量 会议
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2017/4/25
Take this opportunity to share your research at SPIE Optical Metrology 2017. Come to Munich to meet with users and researchers to discuss the latest inventions and applications in the field of optical...
2017年量子检测，计量和设备研讨会（Symposium ED12—Quantum Sensing,Metrology and Devices）
2017年 量子检测，计量和设备 研讨会
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2017/1/13
The symposium addresses key progress in the field on Quantum sensing. It is now becoming apparent that quantum-spin and photon manipulation techniques using solid-state qubits can be used for ultrapre...
2017年SPIE微光刻的计量，检查和过程控制会议（Metrology,Inspection,and Process Control for Microlithography XXXI）
2017年 SPIE微光刻的计量，检查和过程控制 会议
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2017/1/12
Review conference details by clicking on the titles below. These details include paper titles, authors, schedules and abstracts. View Proceedings from last year.SPIE conference papers are published in...
2017第10届慢光，快光和光电原子精密计量研讨会（Slow Light,Fast Light,and Opto-Atomic Precision Metrology X）
2017 第10届 慢光，快光和光电原子精密计量 研讨会
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2017/1/12
OPTO is organized into eight tracks. Choose a track and click to see the list of conferences.Review conference details by clicking on the titles below. These details include paper titles, authors, sch...